Hybrid approach to software defect prediction and classification using variational autoencoder and scalable graph attention network
摘要
Software Defect Prediction (SDP) plays an important role in enhancing software reliability and reducing the effort required to maintain the product. In this paper, a new framework for SDP is proposed that combines an optimized Variational Autoencoder (VAE) with a Scalable Graph Relearn Attention Network (SGRAN) to address issues of class imbalance, limited labeled data, and overfitting. To aid convergence and data set balancing, a hybrid Particle Swarm Optimization–Chaotic Butterfly Optimization Algorithm (PSO–CBOA) is used in the framework. The optimized VAE is used to learn patterns of latent defects, while SGRAN is used to improve the classification capabilities. The results of the experiment showed that the VAE–CBOA model achieved classification accuracy of 99.07% and an F1-score of 99.01%. In comparison, SGRAN achieved 98.02% accuracy and 98.92% recall, both significantly outperforming traditional methods.