This paper presents a thorough investigation of AlN/ \(\beta \) -Ga \(_2\) O \(_3\) , MOSHEMTs selectively doped with silicon (Si), sulfur (S), selenium (Se), or stannum (Sn) within a precise 10 nm region of the \(\beta \) -Ga \(_2\) O \(_3\) channel. Leveraging the intrinsic ultra-wide bandgap of \(\beta \) -Ga \(_2\) O \(_3\) , doping is employed to significantly boost electron charge density and elevate device performance. Our comparative study establishes silicon as the superior dopant, delivering the highest electron current density ( \(\sim 6 \times 10^5\) A/cm \(^2\) ) and exceptional electron mobility exceeding 110 cm2/Vs at the heterointerface. This outstanding performance is linked to Si’s low activation energy (2.5% at \(2 \times 10^{19}\) cm-3) and efficient carrier generation, resulting in a robust and high-density two-dimensional electron gas (2DEG) of \(10^{13}\) cm-2. The Si-doped MOSHEMT demonstrates remarkable DC, RF, and linearity metrics, with detailed analyses of transconductance and its higher-order derivatives (gm2, gm3) revealing dramatically reduced distortion and expanded dynamic range. These results underscore the transformative potential of Si-doped AlN/ \(\beta \) -Ga \(_2\) O \(_3\) MOSHEMTs as high-linearity, high-efficiency devices ready to meet the stringent demands of next-generation RF and power electronics applications.