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Industrial product surface defect detection via the fast denoising diffusion implicit model

  • Yue Wang,
  • Yong Yang,
  • Mingsheng Liu,
  • Xianghong Tang,
  • Haibin Wang,
  • Zhifeng Hao,
  • Ze Shi,
  • Gang Wang,
  • Botao Jiang,
  • Chunyang Liu

摘要

In the age of intelligent manufacturing, surface defect detection plays a pivotal role in the automated quality control of industrial products, constituting a fundamental aspect of smart factory evolution. Considering the diverse sizes and feature scales of surface defects on industrial products and the difficulty in procuring high-quality training samples, the achievement of real-time and high-quality surface defect detection through artificial intelligence technologies remains a formidable challenge. To address this, we introduce a defect detection approach grounded in the Fast Denoising Probabilistic Implicit Models. Firstly, we propose a noise predictor influenced by the spectral radius feature tensor of images. This enhancement augments the ability of generative model to capture nuanced details in non-defective areas, thus overcoming limitations in model versatility and detail portrayal. Furthermore, we present a loss function constraint based on the Perron-root. This is designed to incorporate the constraint within the representational space, ensuring the denoising model consistently produces high-quality samples. Lastly, comprehensive experiments on both the Magnetic Tile and Market-PCB datasets, benchmarked against nine most representative models, underscore the exemplary detection efficacy of our proposed approach.