Ordering of europium magnetic domains in silicon at room temperature
摘要
The magnetic properties of silicon doped with europium by the method of “low-temperature” diffusion were studied. The surface composition of the resulting material was determined by the EDS method. The surface concentration of europium is 4.6 atomic percent (1.45 × 1022 cm−3) and exceeds the maximum volumetric solubility of europium in silicon. The magnetic state of the samples was studied by MFM and SQUID methods. It was shown that magnetic domains similar to domains in magnetic thin films are formed in the obtained samples at room temperature.