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<p>Tin oxide thin films were successfully prepared by the sol-gel spin coating method and post-annealed at 300, 400, 500, 600, and 700&#xa0;° C. XRD analysis shows that at a temperature of 600 ° C onwards, tin oxide thin film shows a crystalline nature. FESEM analysis reveals that the average particle size changes according to the change in the post-annealing temperature. XPS confirms the formation of tin oxide thin films, and the presence of oxygen vacancies was responsible for the n-type conduction of tin oxide thin films. From the UV-Visible analysis, the optical properties such as transmittance, absorbance, reflectance, and the band gap energies were studied. The optical and dielectric constants obtained from the ellipsometry analysis were comparable with the values theoretically calculated from the data obtained from the UV-Visible analysis. All the annealed films show a high refractive index comparable with the theoretical value of the tin oxide material. The valence and conduction band potentials were evaluated.</p>

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Variation of optical constants and structural properties of tin oxide thin films with post annealing temperatures

  • 期刊论文

  • 发表日期：

    2025年11月28日

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  • S. S. Soumya

摘要

Tin oxide thin films were successfully prepared by the sol-gel spin coating method and post-annealed at 300, 400, 500, 600, and 700 ° C. XRD analysis shows that at a temperature of 600 ° C onwards, tin oxide thin film shows a crystalline nature. FESEM analysis reveals that the average particle size changes according to the change in the post-annealing temperature. XPS confirms the formation of tin oxide thin films, and the presence of oxygen vacancies was responsible for the n-type conduction of tin oxide thin films. From the UV-Visible analysis, the optical properties such as transmittance, absorbance, reflectance, and the band gap energies were studied. The optical and dielectric constants obtained from the ellipsometry analysis were comparable with the values theoretically calculated from the data obtained from the UV-Visible analysis. All the annealed films show a high refractive index comparable with the theoretical value of the tin oxide material. The valence and conduction band potentials were evaluated.