Modified Techniques for Nanoparticle Characterization

The synthesis of nanoparticles with a specific size and shape is a great challenge despite the availability of several preparation techniques. The accurate characterization of the prepared nanoparticles is also a critical research issue due to errors involved in every characterization technique. The most widely used techniques are X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), UV–vis spectroscopy, and Fourier transform infrared spectroscopy (FTIR). Recently, optical microscopy has been reported as a characterization method for nanostructures with less damage to the sample in comparison with electron microscopy. The adaptations in optical microscopy to view ID and 2D nanostructures like carbon nanotube (CNT), DNA, proteins, and nanomaterial grain boundaries are presented. Compared with electron beam techniques, optical imaging techniques are probes that damage the materials to a lesser extent. In this manuscript, adaptations performed in optical microscopy, electron microscopy, and AFM to view nanostructures are discussed.