A Comprehensive Failure Analysis Approach Utilizing High-Resolution Targeted Patterns (HRTP) for ATPG Diagnosis Resolution Improvement, Test Coverage Resolution, and Further Fault Localization
摘要
This paper discusses a comprehensive failure analysis approach to digital failures. High-resolution targeted patterns (HRTP) are highlighted along with their advantages in failure analysis by aiding in automated test pattern generation (ATPG) diagnoses resolution improvement, increasing the chance of detecting fault not detected by patterns implemented on automated test equipment (ATE), determine a potential test screen, provide stimulus for further fault localization, and increase the analysis success rate. This comprehensive approach and the use of HRTP have proven very helpful in the analysis of internal requests and customer returns. Three cases will be discussed in this paper to highlight these advantages.