Fault Simulation for Dynamic Failures in Analog and Mixed-Signal Circuits

Identifying defects that cause dynamic electrical behavior is a recurring issue for failure analysts, particularly in analog circuits where standard fault isolation techniques are frequently ineffective. This paper proposes a novel approach that utilizes industrial fault simulators in conjunction with standard analysis methods to resolve failure analyses in analog circuits. Furthermore, we showcase techniques to modify fault simulation for dynamic electrical failure modes. The efficacy of this method is demonstrated through successful fault isolation outcomes from real-world failure analyses of oscillators, which are frequent in analog and mixed-signal circuits.