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<p>Suspension plasma spraying (SPS) enables the fabrication of environmental barrier coatings (EBCs) with complex multilayer architectures; however, degradation in such systems often initiates locally at buried interfaces, making it difficult to resolve using conventional laboratory-scale characterization techniques. In this work, the applicability of synchrotron-based micro-x-ray diffraction (µXRD), combined with micro-x-ray fluorescence (µXRF), is evaluated for the characterization of SPS-deposited ytterbium disilicate (YbDS) EBCs. An as-sprayed YbDS coating was investigated as a baseline case to examine differences between conventional XRD and spatially resolved µXRD, while an annealed and CMAS-exposed YbDS coating was studied as a service-relevant case to probe localized phase evolution. The samples were selected from previously optimized SPS process conditions and are not intended for direct comparison. Laboratory-scale XRD provided global phase information, whereas µXRD enabled layer-specific phase identification and resolved localized interfacial features. In the as-sprayed condition, µXRD confirmed phase-pure YbDS, resolved the crystallinity of individual coating layers, and verified the absence of unintended interfacial reaction phases that are not accessible by conventional XRD. In the annealed + CMAS-exposed coating, µXRD and µXRF revealed the formation of a calcium–ytterbium–silicate oxyapatite phase confined to the YbDS/Si interface, highlighting the localized nature of CMAS-induced degradation. These results demonstrate that synchrotron microanalysis provides valuable complementary insight for probing localized phase evolution in thermally sprayed EBC systems.</p>

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High-Resolution Synchrotron µXRD and µXRF for Local Phase and Elemental Analysis in Suspension Plasma Sprayed Environmental Barrier Coatings

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2026年2月8日

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  • Chinmayee Nayak,
  • Arman Hasani,
  • Gidla Vinay,
  • Ermei Mäkilä,
  • Ebenezer Owusu,
  • Nikhil Kamboj,
  • Malgorzata Grazyna Makowska,
  • Alex Lynam,
  • Acacio Rincon Romero,
  • Sneha Goel,
  • Tanvir Hussain,
  • Antti Salminen,
  • Ashish Ganvir

摘要

Suspension plasma spraying (SPS) enables the fabrication of environmental barrier coatings (EBCs) with complex multilayer architectures; however, degradation in such systems often initiates locally at buried interfaces, making it difficult to resolve using conventional laboratory-scale characterization techniques. In this work, the applicability of synchrotron-based micro-x-ray diffraction (µXRD), combined with micro-x-ray fluorescence (µXRF), is evaluated for the characterization of SPS-deposited ytterbium disilicate (YbDS) EBCs. An as-sprayed YbDS coating was investigated as a baseline case to examine differences between conventional XRD and spatially resolved µXRD, while an annealed and CMAS-exposed YbDS coating was studied as a service-relevant case to probe localized phase evolution. The samples were selected from previously optimized SPS process conditions and are not intended for direct comparison. Laboratory-scale XRD provided global phase information, whereas µXRD enabled layer-specific phase identification and resolved localized interfacial features. In the as-sprayed condition, µXRD confirmed phase-pure YbDS, resolved the crystallinity of individual coating layers, and verified the absence of unintended interfacial reaction phases that are not accessible by conventional XRD. In the annealed + CMAS-exposed coating, µXRD and µXRF revealed the formation of a calcium–ytterbium–silicate oxyapatite phase confined to the YbDS/Si interface, highlighting the localized nature of CMAS-induced degradation. These results demonstrate that synchrotron microanalysis provides valuable complementary insight for probing localized phase evolution in thermally sprayed EBC systems.