Microscopic Mechanism for the Interfacial Diffusion in Mo/Si Multilayers from Molecular Dynamics Simulations
摘要
Interfacial diffusion is a critical factor influencing the performance and stability of extreme ultraviolet lithography reflective mirrors composed of Mo/Si multilayers. This study explores the diffusion behavior at the Mo/Si interface focusing on the temperature effect using molecular dynamics simulations. Diffusion at the Mo/Si interface is found to be asymmetric, with Mo atoms diffusing more seriously than Si atoms. As diffusion time increases, the diffusion rate gradually decreases, and the diffusion process eventually reaches saturation. Molecular dynamics simulations disclose the underlying mechanism for the slowing of the diffusion rate to be the formation of interfacial compounds