<p>A polycrystalline ceramic, Na₂Pb₂Nd₂W₂Ti₄V₄O_30, was developed using a conventional moderate-temperature mixed-oxide process. The development of the material using the mentioned conditions was already validated using an x-ray diffraction technique. The variation of the dielectric constant with frequency can reveal the predominant polarization in the molecule in a specific range of frequencies. The electrical characteristics of the materials were looked into using the AC impedance spectroscopy technique. Systematic analysis of impedance and its related variables suggest that the electrical properties of the material are considerably temperature-dependent&#xa0;and have an adequate correlation with their microstructure. Electrical processes in the material&#xa0;arise due to its bulk (intragrain) characteristics. The bulk resistance, determined using complex impedance spectra, declines with enhancing temperature, indicating a characteristic of semiconductors (NTCR). A change in peak broadening as the temperature rises suggests that the material contains temperature-dependent relaxation mechanisms. The sample shows an increase in conduction with temperature and frequency. The analysis of the complex electric modulus shows that the relaxation process is thermally triggered, with intrinsic dominance of charge carrier hopping with small polarons. The dc conductivity increases with increasing temperature, indicating the NTCR behavior of the material. Today’s industries greatly benefit from studying ferroelectrics of a new class of tungsten-bronze structure vanadate, Na₂Pb₂Nd₂W₂Ti₄V₄O₃₀.</p>