High-Performance VO2 Thin Film Prepared Via Room-Temperature-Deposition and Air-Annealing Treatment
摘要
Vanadium dioxide (VO2) exhibits a unique metal-insulator transition near room temperature, making it a promising candidate for novel optoelectronic devices. However, VO2 thin films with superior phase-transition performance exhibit a narrow process window, thereby restricting their practical applications. In this work, VOx thin films were synthesized via reactive magnetron sputtering under varying oxygen flow rates, followed by air-annealing treatment to obtain high-performance VO2 thin films. The influence of oxygen flow rate during deposition on the phase transition characteristics was systematically investigated through x-ray diffraction (XRD) analysis, optical/electrical thermal hysteresis curves, high/low-temperature optical transmission spectra, and surface morphology, respectively. Optimized VO2 films achieved under 0.8 sccm oxygen flow rate and 40-min 360°C air-annealing treatment demonstrated over 50% transmittance change at 1550 nm and a three-order-of-magnitude reduction in sheet resistance. This study significantly mitigates the fabrication challenges of VO2 thin films, thereby advancing their practical applications.