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<p>This study reports a non-aqueous sol–gel spin-coating method for the synthesis and analysis of copper-doped zirconia thin films deposited on silicon substrates, exhibiting uniform thickness and distinctive morphology. The thin films were characterized post-annealing at 700°C using advanced analytical techniques. Grazing incidence x-ray diffraction revealed that the films crystallized in a pure tetragonal phase, with an overall thickness of less than 100&#xa0;nm for all samples. The effect of doping on the band gap was evaluated using UV-Vis spectroscopy, which showed a reduction in the band gap attributed to the formation of oxygen vacancies. Surface properties were investigated using field-emission scanning electron microscopy and atomic force microscopy. The surface morphology exhibited minimal roughness with distinctive bowl-shaped features distributed across the film. Depth profiling was conducted using x-ray photoelectron spectroscopy. This study demonstrates that the suppressed surface roughness and homogeneous film thickness of copper-doped tetragonal zirconia films, along with their inherent mechanical strength and durability, make them highly suitable as smooth, transparent, and high-quality protective coatings for optical lenses and display screens.</p>

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Structural and Morphological Analysis of Copper-Doped Zirconia Thin Films Cast on Silicon Substrates

  • 期刊论文

  • 发表日期：

    2025年6月22日

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  • Latief Mohi Ud Din,
  • Mohd Rouf Khan,
  • Gulzar Ahmad Lone,
  • Hendrik C. Swart,
  • Vijay Kumar

摘要

This study reports a non-aqueous sol–gel spin-coating method for the synthesis and analysis of copper-doped zirconia thin films deposited on silicon substrates, exhibiting uniform thickness and distinctive morphology. The thin films were characterized post-annealing at 700°C using advanced analytical techniques. Grazing incidence x-ray diffraction revealed that the films crystallized in a pure tetragonal phase, with an overall thickness of less than 100 nm for all samples. The effect of doping on the band gap was evaluated using UV-Vis spectroscopy, which showed a reduction in the band gap attributed to the formation of oxygen vacancies. Surface properties were investigated using field-emission scanning electron microscopy and atomic force microscopy. The surface morphology exhibited minimal roughness with distinctive bowl-shaped features distributed across the film. Depth profiling was conducted using x-ray photoelectron spectroscopy. This study demonstrates that the suppressed surface roughness and homogeneous film thickness of copper-doped tetragonal zirconia films, along with their inherent mechanical strength and durability, make them highly suitable as smooth, transparent, and high-quality protective coatings for optical lenses and display screens.