Enhancing Ionic Transport and Dielectric Stability in xNa₂O-(0.3-x)TeO₂–0.40ZnO–0.30P₂O₅ Glass Systems for Energy Storage Applications
摘要
The present study investigates the structural, optical, electrical, dielectric, and impedance properties of the xNa₂O–(0.3-x)TeO₂–0.40ZnO–0.30P₂O₅ (NTZP) glass system (x = 0.05, 0.10, 0.15, and 0.20) synthesized via the melt-quenching technique. x-ray diffraction (XRD) confirmed the amorphous nature of all compositions. Density decreased from 3.71 g/cm3 (x = 0.05) to 3.02 g/cm3 (x = 0.20), while molar volume increased from 30.01 cm3/mol to 43.07 cm3/mol, indicating network expansion. Optical studies revealed a decrease in the optical bandgap (Eₒₚₜ) from 3.15 to 2.43 eV and an increase in Urbach energy (EU) from 0.31 eV to 0.39 eV, signifying enhanced structural disorder. Electrical and dielectric analyses confirmed that total conductivity (σtotal) increased with Na₂O content, while DC activation energy (Edc) decreased from 0.78 eV to 0.63 eV, indicating enhanced charge carrier mobility. AC conductivity followed the universal power law, with activation energy (Eac) decreasing from 0.30 eV to 0.19 eV, suggesting a hopping-based conduction mechanism. Impedance spectroscopy revealed a decrease in bulk resistance, and at x = 0.20, an additional relaxation process emerged, attributed to space charge effects. Modulus analysis indicated thermally activated relaxation, with relaxation energy (Eτ) decreasing from 0.469 eV (x = 0.05) to 0.219 eV (x = 0.20). Modulus scaling confirmed a nearly temperature-independent relaxation behavior. The results demonstrate that increasing Na₂O content enhances ionic conduction, dielectric stability, and charge transport, making NTZP glass systems promising candidates for solid-state electrolytes and high-performance capacitors in energy storage applications.
Graphical abstract