Photodetection and Thermistor Applications of Cu-Cd-S Thin Film
摘要
In this work, the photosensitivity of Cu-Cd-S thin film was investigated by exposing the film to three light sources and measuring the photoresistance value between 250 nm and 750 nm. For thermistor application, resistance was measured at intervals of 20 K within a temperature range of 293 K and 373 K. The peak photoresistance occurred at 536 nm, which corresponds to a bandgap of 2.31 eV for the Cu-Cd-S thin film. The thermal sensor response was found to increase as the temperature increased, indicating a positive-temperature-coefficient (PTC) thermistor with a PTC value of 0.00323/K and sensitivity of 0.07119 Ω/K. These photoelectrical and thermal sensing properties of the Cu-Cd-S thin films make them suitable for application as a photodetector within the UV–visible range of the electromagnetic spectrum and as a PTC thermistor for regulating temperature in various appliances and overcurrent detection circuits in place of fuses.