Scholarlink

Purpose <p>Boron neutron capture therapy (BNCT) is a promising cancer treatment; however, it poses the risk of soft errors in cardiac implantable electronic devices (CIEDs). This study aimed to assess the occurrence of soft errors in CIEDs during BNCT and to correlate these errors with the neutron flux.</p> Materials and methods <p>A field-programmable gate array (FPGA) was used as a surrogate for CIED to measure the soft errors under thermal and epithermal neutron irradiation. The neutron flux at the FPGA position was assessed using gold wire activation, and the effective soft-error cross-section was calculated.</p> Results <p>The neutron flux exhibited a clear inverse relationship with distance from the irradiation center. The number of soft errors observed in the FPGA mirrored this trend, showing a significant reduction as the distance from the beam center increased. A strong linear correlation was identified between the thermal neutron flux and soft-error rate, and a consistent reaction cross-section was derived.</p> Conclusion <p>This study provides foundational data on soft-error risks in electronic devices during BNCT. Our findings indicate that increasing the distance from the beam center significantly reduces the soft-error rate. These insights are crucial for developing robust radiotherapy safety guidelines for patients with implanted electronic devices.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Assessment of soft error risks to cardiac implantable electronic devices for boron neutron capture therapy using field-programmable gate arrays

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2026年4月25日

查看全文
  • Takayuki Yagihashi,
  • Makoto Sakai,
  • Masashi Yamanaka,
  • Yudai Kawakami,
  • Reika Imazu,
  • Kazunori Nitta,
  • Takahiro Shimo,
  • Shintaro Shiba

摘要

Purpose

Boron neutron capture therapy (BNCT) is a promising cancer treatment; however, it poses the risk of soft errors in cardiac implantable electronic devices (CIEDs). This study aimed to assess the occurrence of soft errors in CIEDs during BNCT and to correlate these errors with the neutron flux.

Materials and methods

A field-programmable gate array (FPGA) was used as a surrogate for CIED to measure the soft errors under thermal and epithermal neutron irradiation. The neutron flux at the FPGA position was assessed using gold wire activation, and the effective soft-error cross-section was calculated.

Results

The neutron flux exhibited a clear inverse relationship with distance from the irradiation center. The number of soft errors observed in the FPGA mirrored this trend, showing a significant reduction as the distance from the beam center increased. A strong linear correlation was identified between the thermal neutron flux and soft-error rate, and a consistent reaction cross-section was derived.

Conclusion

This study provides foundational data on soft-error risks in electronic devices during BNCT. Our findings indicate that increasing the distance from the beam center significantly reduces the soft-error rate. These insights are crucial for developing robust radiotherapy safety guidelines for patients with implanted electronic devices.