Sulfurization-induced microstructural tuning of electroless-deposited NiO thin films for enhanced pseudocapacitive performance
摘要
The development of pseudocapacitive electrodes with enhanced charge-storage capability is crucial for advancing high-performance electrochemical energy storage devices. In this work, NiO and NiOₓSγ thin-film electrodes were directly fabricated via a facile electroless deposition route using ammonium thiosulfate as an in-situ sulfur source to investigate the influence of sulfur incorporation on the microstructure and electrochemical performance. Structural characterization revealed that sulfur incorporation transformed the sparsely distributed NiO nanocrystals into a dense, interconnected mesoporous architecture with increased electrochemically active surface area and improved ion-transport pathways. X-ray diffraction and Raman analyses confirmed the formation of a mixed NiOₓSγ phase with sulfur-induced structural defects. Electrochemical measurements demonstrated that sulfur incorporation significantly enhanced the pseudocapacitive behavior, yielding a specific capacitance of 305 F g⁻¹ at 10 mV s⁻¹ and 164 F g⁻¹ at 0.2 mA cm⁻², together with improved charge-transfer kinetics and reduced interfacial resistance compared with pristine NiO. Mott–Schottky analysis further revealed an increased donor density and a more negative flat-band potential, indicating enhanced charge transport characteristics. These results demonstrate that sulfur-induced microstructural and electronic modulation of electroless-deposited NiOₓSγ thin films provides an effective strategy for developing scalable, high-performance pseudocapacitive electrodes for next-generation electrochemical energy storage devices.