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<p>In the present study, the systematic understanding of the dielectric relaxor dynamics and electric transport properties of the La<sub>0.7</sub>Bi<sub>0.3</sub>MnO<sub>3</sub> sample has been investigated by using various techniques and models. The exhibition of the dielectric dispersion is attributed to the Maxwell–Wagner-type relaxation. The AC conductivity studies describe the conduction mechanism mainly due to the hopping of charge carriers within the nearest neighbouring available sites. The complex electric modulus study supports the non-Debye-type relaxation mechanism. The Cole − Cole plot of the complex electric modulus shows a single semi-circle arc, which indicates the mobility of the charge carriers is of short-range type and the relaxations are solely due to the grain boundary contributions. The DC conductivity studies based on Schnakenberg’s type hopping model at <i>T</i> &lt; <i>θ</i><sub>D</sub>/2 and Greave’s hopping model at <i>T</i> &gt; <i>θ</i><sub>D</sub>/2, respectively, confirm the conduction process is due to a thermally activated polaronic hopping mechanism. The present investigation of relaxor dynamics and the electrical transport properties of the studied sample is of great interest due to its unlimited practical applications in many electronic and memory-based devices for various industrial appliances and fabrications of next-generation sensors.</p>

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Dielectric relaxor dynamics and electrical transport properties in \({\mathrm{La}}_{0.7}{\mathrm{Bi}}_{0.3}{\mathrm{MnO}}_3\)  

  • 期刊论文

  • 发表日期：

    2025年3月22日

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  • Punith Kumar V.

摘要

In the present study, the systematic understanding of the dielectric relaxor dynamics and electric transport properties of the La0.7Bi0.3MnO3 sample has been investigated by using various techniques and models. The exhibition of the dielectric dispersion is attributed to the Maxwell–Wagner-type relaxation. The AC conductivity studies describe the conduction mechanism mainly due to the hopping of charge carriers within the nearest neighbouring available sites. The complex electric modulus study supports the non-Debye-type relaxation mechanism. The Cole − Cole plot of the complex electric modulus shows a single semi-circle arc, which indicates the mobility of the charge carriers is of short-range type and the relaxations are solely due to the grain boundary contributions. The DC conductivity studies based on Schnakenberg’s type hopping model at T < θD/2 and Greave’s hopping model at T > θD/2, respectively, confirm the conduction process is due to a thermally activated polaronic hopping mechanism. The present investigation of relaxor dynamics and the electrical transport properties of the studied sample is of great interest due to its unlimited practical applications in many electronic and memory-based devices for various industrial appliances and fabrications of next-generation sensors.