<p>In order to analyze the formation mechanism and explore the potential applications of <i>Canna</i> starch and its derivatives (<i>Canna</i> Starch OSA Ester (CSOE)) and <i>Canna</i> Starch Phosphate Ester (CSPE)), the samples were subjected to an environment of iodine. The resulting complex was analyzed using small angle X-ray scattering and fluorescence (SAXS and XRF). The findings revealed that CSPE exhibited the highest binding capacity (5.19% at aw 0.15; 25.03% at aw 0.99). Interestingly, iodine tended to accumulate within the hilum rather than the periphery of the starch particles, resulting in smoother surfaces. Furthermore, it was observed that the process of octenylsuccinylation and phosphorylation caused a shift in the scattering peak towards higher values in the SAXS graphs, indicating a shorter lamellar repeat distance (CSPE, 9.52&#xa0;nm; CSOE, 8.16&#xa0;nm). These results have the potential to advance characterization techniques and contribute to the development of applications involving amylose-restrained materials.</p>

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Chemical Modification Method Determines the Formation of Starch-Iodine Complex: an Insight into the Lamellar Structure and Iodine Adsorption Behavior

  • Fan Xie,
  • Xiaohong Lan,
  • Zhengwu Wang,
  • Jinhong Wu

摘要

In order to analyze the formation mechanism and explore the potential applications of Canna starch and its derivatives (Canna Starch OSA Ester (CSOE)) and Canna Starch Phosphate Ester (CSPE)), the samples were subjected to an environment of iodine. The resulting complex was analyzed using small angle X-ray scattering and fluorescence (SAXS and XRF). The findings revealed that CSPE exhibited the highest binding capacity (5.19% at aw 0.15; 25.03% at aw 0.99). Interestingly, iodine tended to accumulate within the hilum rather than the periphery of the starch particles, resulting in smoother surfaces. Furthermore, it was observed that the process of octenylsuccinylation and phosphorylation caused a shift in the scattering peak towards higher values in the SAXS graphs, indicating a shorter lamellar repeat distance (CSPE, 9.52 nm; CSOE, 8.16 nm). These results have the potential to advance characterization techniques and contribute to the development of applications involving amylose-restrained materials.