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<p>The characterization of the optical constants of single-layer graphene has been the subject of deep investigation in the last 2&#xa0;decades, and the optical anisotropy has been discovered to be an important parameter linked to the structural defects of the plane of the carbon atoms. Using graphene-loaded coupled plasmon-waveguide resonator, which offers pure transverse electric or transverse magnetic electromagnetic modes, we demonstrate the possibility to characterize the optical anisotropy using evanescent electromagnetic fields in the visible and middle-infrared range of a single, double, and triple layer of graphene. On the assumption that a universal opacity of graphene holds for both in-plane and out-plane electronic displacement, we extract the anisotropic coefficient of the graphene layers with an accuracy of about 20%. The results are coherent with the literature and indicate that coupled plasmon-waveguide resonator spectroscopy is a valid, low-cost, and simple technique for the alternative optical characterization of uniaxial anisotropic bidimensional materials.</p>

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Optical Anisotropy of Multilayer Graphene Probed by Coupled Plasmon-Waveguide Resonators

  • 期刊论文

  • 发表日期：

    2025年8月19日

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  • Quaid Zaman,
  • Giancarlo Margheri,
  • André do Nascimento Barbosa,
  • Nimai Socha,
  • Fernando Lazaro Freire Jr,
  • Marcelo Eduardo Huguenin Maia da Costa,
  • Tahir Tahir,
  • Rajwali Khan,
  • Karlo Queiroz da Costa,
  • Sajid Farooq,
  • Tommaso Del Rosso

摘要

The characterization of the optical constants of single-layer graphene has been the subject of deep investigation in the last 2 decades, and the optical anisotropy has been discovered to be an important parameter linked to the structural defects of the plane of the carbon atoms. Using graphene-loaded coupled plasmon-waveguide resonator, which offers pure transverse electric or transverse magnetic electromagnetic modes, we demonstrate the possibility to characterize the optical anisotropy using evanescent electromagnetic fields in the visible and middle-infrared range of a single, double, and triple layer of graphene. On the assumption that a universal opacity of graphene holds for both in-plane and out-plane electronic displacement, we extract the anisotropic coefficient of the graphene layers with an accuracy of about 20%. The results are coherent with the literature and indicate that coupled plasmon-waveguide resonator spectroscopy is a valid, low-cost, and simple technique for the alternative optical characterization of uniaxial anisotropic bidimensional materials.