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<p>This work investigates thermally stimulated diffusion of Ag into thin porous films of chalcogenide glass (ChG) using the method of surface plasmon-polariton (SPP) resonance registration, which, for such structures, proves to be more sensitive than conventional photometric techniques. A silver diffraction grating with a period of 515&#xa0;nm and an optimal modulation depth for the probing radiation wavelength was used as the substrate for SPP excitation. A thin As<sub>2</sub>S<sub>3</sub> layer was thermally deposited onto the silver grating in vacuum. Annealing of the samples was conducted in the temperature range of 100–130&#xa0;°C. Thermally stimulated changes in the As<sub>2</sub>S<sub>3</sub> film due to silver diffusion were registered by analyzing the position and shape changes of the SPP resonance in the angular dependence of specular reflection of p-polarized He–Ne laser radiation (λ = 632.8&#xa0;nm). The detection of SPP resonance shifts enabled the determination of changes in the refractive index of the As<sub>2</sub>S<sub>3</sub> layer due to silver doping, and subsequently, the calculation of the kinetics of thermally stimulated Ag concentration growth in the As<sub>2</sub>S<sub>3</sub> film, as well as the corresponding decrease in silver layer thickness (δ<i>d</i><sub>Ag</sub>). At all studied annealing temperatures, the δ<i>d</i><sub>Ag</sub> kinetics exhibited linear segments with respect to <i>t</i><sup>1/2</sup> (<i>t</i> – annealing time), allowing estimation of the Ag diffusion coefficients. It was established that the temperature dependence of the diffusion coefficient follows the Arrhenius equation with an activation energy equal to 1.5 ± 0.1&#xa0;eV. Possible mechanisms of thermally stimulated silver diffusion in thin porous As<sub>2</sub>S<sub>3</sub> films are discussed.</p>

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Surface Plasmon-Polariton Study of Thermally Stimulated Diffusion of Ag in thin As2S3 Films

  • 期刊论文

  • 发表日期：

    2026年1月24日

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  • Viktor I. Mynko,
  • Ivan Z. Indutnyi,
  • Mykola V. Sopinskyy,
  • Viktor A. Dan’ko,
  • Sergii V. Mamykin

摘要

This work investigates thermally stimulated diffusion of Ag into thin porous films of chalcogenide glass (ChG) using the method of surface plasmon-polariton (SPP) resonance registration, which, for such structures, proves to be more sensitive than conventional photometric techniques. A silver diffraction grating with a period of 515 nm and an optimal modulation depth for the probing radiation wavelength was used as the substrate for SPP excitation. A thin As2S3 layer was thermally deposited onto the silver grating in vacuum. Annealing of the samples was conducted in the temperature range of 100–130 °C. Thermally stimulated changes in the As2S3 film due to silver diffusion were registered by analyzing the position and shape changes of the SPP resonance in the angular dependence of specular reflection of p-polarized He–Ne laser radiation (λ = 632.8 nm). The detection of SPP resonance shifts enabled the determination of changes in the refractive index of the As2S3 layer due to silver doping, and subsequently, the calculation of the kinetics of thermally stimulated Ag concentration growth in the As2S3 film, as well as the corresponding decrease in silver layer thickness (δdAg). At all studied annealing temperatures, the δdAg kinetics exhibited linear segments with respect to t1/2 (t – annealing time), allowing estimation of the Ag diffusion coefficients. It was established that the temperature dependence of the diffusion coefficient follows the Arrhenius equation with an activation energy equal to 1.5 ± 0.1 eV. Possible mechanisms of thermally stimulated silver diffusion in thin porous As2S3 films are discussed.