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<p>Spectrometers that operate without dispersive optics or filter arrays offer a compact route toward integrated mid-infrared sensing. However, a key challenge is to effectively encode and decode wavelength information within a single detector. Here, we demonstrate a bias-tunable spectrometer based on composition-graded Hg<sub>1−<i>x</i></sub>Cd<sub><i>x</i></sub>Te (HgCdTe), in which a continuous bandgap gradient enables electrically controlled spectral selectivity over the 2–3 µm range. A planar n-on-p junction is embedded within the graded absorber, allowing the depletion region to extend into narrower-bandgap regions under applied bias, resulting in a systematic red-shift of the spectral response. Spectral information encoded in the bias-dependent current-voltage (<i>I</i>-<i>V</i>) characteristics is decoded using an implicit response matrix learning (IRML) framework. A supervised neural network directly learns the nonlinear mapping from <i>I</i>-<i>V</i> curves to incident spectra without explicit response matrix calibration. Accurate reconstruction is achieved for broadened monochromatic inputs, densely sampled sequential narrowband inputs, and experimentally measured spectra. A mid-wave infrared imaging proof-of-concept further visualizes bias-dependent spectral contrast via differential imaging. Together, these results demonstrate a compact and electrically tunable HgCdTe spectrometer architecture compatible with scalable HgCdTe detector technology.</p>

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Mid-wave infrared miniature spectrometer based on the compositional gradient of HgCdTe

  • 期刊论文

  • 发表日期：

    2026年7月16日

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  • Ruotong Yin,
  • Qianru Zhao,
  • Yan Chen,
  • Wenxin Li,
  • Tao Hu,
  • Dongyang Zhao,
  • Haoran Yan,
  • Hanxue Jiao,
  • Tie Lin,
  • Hong Shen,
  • Xiangjian Meng,
  • Wei Bai,
  • Xudong Wang,
  • Junhao Chu,
  • Jianlu Wang

摘要

Spectrometers that operate without dispersive optics or filter arrays offer a compact route toward integrated mid-infrared sensing. However, a key challenge is to effectively encode and decode wavelength information within a single detector. Here, we demonstrate a bias-tunable spectrometer based on composition-graded Hg1−xCdxTe (HgCdTe), in which a continuous bandgap gradient enables electrically controlled spectral selectivity over the 2–3 µm range. A planar n-on-p junction is embedded within the graded absorber, allowing the depletion region to extend into narrower-bandgap regions under applied bias, resulting in a systematic red-shift of the spectral response. Spectral information encoded in the bias-dependent current-voltage (I-V) characteristics is decoded using an implicit response matrix learning (IRML) framework. A supervised neural network directly learns the nonlinear mapping from I-V curves to incident spectra without explicit response matrix calibration. Accurate reconstruction is achieved for broadened monochromatic inputs, densely sampled sequential narrowband inputs, and experimentally measured spectra. A mid-wave infrared imaging proof-of-concept further visualizes bias-dependent spectral contrast via differential imaging. Together, these results demonstrate a compact and electrically tunable HgCdTe spectrometer architecture compatible with scalable HgCdTe detector technology.