Diffraction-Based Residual Stress Determination in Uranium-6wt.% Niobium Shape Memory Alloy
摘要
This work evaluates the efficacy of diffraction based residual stress determination for materials with monoclinic and triclinic crystal symmetry. Rietveld refinements of full diffraction patterns have been successfully applied to low symmetry materials to determine lattice parameter strains, which then can be used to determine residual stresses. However, the monoclinic and triclinic crystal structures with non-fixed lattice angles make it difficult to even conceptualize how to determine an average strain based upon the changes to the four (a, b, c, γ, for monoclinic) or six (a, b, c, α, β, γ, for triclinic) lattice parameters.
ObjectiveIn our approach, we leverage the refinement of an anisotropy strain parameter with lattice parameters to recalculate lattice strains for individual reflections and use those strains as the basis for determining the overall average strain.
MethodsThis novel Hybrid Elastic Strain Average, HESA, approach enables the inclusion of the multiplicity and texture information at the single grain family level in the averaging without reconstructing texture. Results: We show the accuracy and uncertainty of the stresses determined during uniaxial testing of monoclinic DU-6Nb using the HESA scheme is essentially equivalent to what can be determined for materials with higher crystal symmetry, e.g. cubic, hexagonal and orthorhombic, which have been reported in the literature for decades.
ConclusionsQuantitative comparison of the stresses determined using HESA and traditional strain averaging techniques demonstrates consistently improved fidelity with respect to the known ground truth stress state.