Post-Yield Compression Characterization of Epon 828/DEA Epoxy
摘要
Epoxies are a family of glassy polymers which are widely used as adhesives, encapsulants, and composite matrix materials.
ObjectiveIn this technical note, we examined the stress-strain response of Epon 828/DEA epoxy at temperatures ranging from room temperature to above the glass transition temperature.
MethodsIn particular, the true stress-strain behavior at the reduced center of each specimen was estimated from digital image correlation and the deformation and stress state were compared to those from finite element analysis.
ResultsThe results suggested excellent repeatability based on multiple tests at each temperature and when compared to previous studies at a common temperature. Moreover, it was found that the material exhibited a constant ratio of bulk and shear response, a post-yield decrease in stress by a factor of approximately one-third, and a flat plastic plateau out through a strain of
The data indicate that the interfacial fracture toughness trends in previous work are broadly valid below the glass transition.