Performing Stereo-Measurements with Optimal Patterns Processed by Localised Spectrum Analysis
摘要
Localised Spectrum Analysis is a full-field measurement method which enables processing optimal patterns (i.e. checkerboard patterns) and obtaining high metrological performance. However, LSA was still limited to 2D cases.
ObjectiveThis paper presents stereo-LSA, an extension of the method for stereo image pairs, enabling the measurement of the 3D displacement field on sample surfaces engraved with optimal checkerboard patterns.
MethodsA standard stereo procedure is followed. The LSA formulation is updated to take into account global rotations induced by the stereo angle.
ResultsThe technique is applied to three different cases. A synthetic case is used to validate the stereo implementation, and a comparison is proposed with stereo digital image correlation, routinely used in the community.
ConclusionsStereo-LSA enables measuring 3D-displacement field on a sample surface prepared with checkerboard patterns, leading to high metrological performance.