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<p>Laser powder bed fusion (L-PBF) manufactured AlSi10Mg alloys exhibit a fine silicon-rich network and precipitates, with the nanosized Si-rich particles imparting high mechanical strength. However, the mechanisms underlying their growth remain unclear. To investigate these issues, we examined the effects of variations in scan length, which significantly influence the thermal response, microstructure, and consequently the mechanical properties of AlSi10Mg. The results indicate that a shorter scan length disrupts the microstructure of AlSi10Mg, resulting in a reduction in specimen strength from 487 to 456 MPa. As the scan length decreased from 15 to 1 mm, the Si-rich eutectic network promoted damage and surface defects. This was attributed to heat accumulation caused by the shorter interval time between adjacent tracks under a low temperature gradient. In the fine-grain region, the average diameter of nanoscale Si-rich particles increased from 17.23 to 35.96 nm, with the maximum particle size approaching 80 nm. Particles surrounding gas pores exhibited more pronounced growth due to thermal accumulation caused by the low thermal conductivity of the gas, further contributing to the reduction in strength.</p>

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Influence of Scan Length on Mechanical Properties and Microstructure of AlSi10Mg in Laser Powder Bed Fusion

  • 期刊论文

  • 发表日期：

    2026年1月1日

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  • J. R. Chen,
  • Y. Zhang,
  • C. Zhang,
  • C. C. Zhou,
  • J. Y. Xie

摘要

Laser powder bed fusion (L-PBF) manufactured AlSi10Mg alloys exhibit a fine silicon-rich network and precipitates, with the nanosized Si-rich particles imparting high mechanical strength. However, the mechanisms underlying their growth remain unclear. To investigate these issues, we examined the effects of variations in scan length, which significantly influence the thermal response, microstructure, and consequently the mechanical properties of AlSi10Mg. The results indicate that a shorter scan length disrupts the microstructure of AlSi10Mg, resulting in a reduction in specimen strength from 487 to 456 MPa. As the scan length decreased from 15 to 1 mm, the Si-rich eutectic network promoted damage and surface defects. This was attributed to heat accumulation caused by the shorter interval time between adjacent tracks under a low temperature gradient. In the fine-grain region, the average diameter of nanoscale Si-rich particles increased from 17.23 to 35.96 nm, with the maximum particle size approaching 80 nm. Particles surrounding gas pores exhibited more pronounced growth due to thermal accumulation caused by the low thermal conductivity of the gas, further contributing to the reduction in strength.