<p>This paper presents a compact planar high-Q microstrip patch antenna–based sensor for dielectric material (DM) characterization. The proposed sensor incorporates a split-ring defected ground structure (DGS) and a split patch loaded with shorting pins to enhance sensitivity. The split-patch antenna sensor (SPAS) achieves a high quality factor of 2827, enabling highly sensitive and resolution in dielectric measurements. The sensor is a single-port structure operating in reflection mode (Rx) over the 2.01–3.14&#xa0;GHz frequency range. Its sensing element consists of a split-patch antenna with a rectangular central strip and shorting pins, which generates a strong localized electric field of approximately 7000&#xa0;V/m. This field enhancement ensures effective interaction with the test dielectric material, leading to accurate characterization. A simple and computationally efficient analytical model is developed to compute the permittivity of unknown dielectric materials (UDMs), achieving a maximum error of less than 4.7%. The proposed sensor is capable of characterizing both thin and thick dielectric samples, and it can be suitable for engineering, material science, industrial quality control, and biomedical sensing applications.</p>

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High-Q Microstrip Antenna-Based High-Sensitivity Sensor for Efficient Dielectric Material Characterisation

  • Ashwani Kumar,
  • Aditya Kumar,
  • Sachin Kumar,
  • Maifuz Ali,
  • Ravi Kumar Arya,
  • P. P. Singh

摘要

This paper presents a compact planar high-Q microstrip patch antenna–based sensor for dielectric material (DM) characterization. The proposed sensor incorporates a split-ring defected ground structure (DGS) and a split patch loaded with shorting pins to enhance sensitivity. The split-patch antenna sensor (SPAS) achieves a high quality factor of 2827, enabling highly sensitive and resolution in dielectric measurements. The sensor is a single-port structure operating in reflection mode (Rx) over the 2.01–3.14 GHz frequency range. Its sensing element consists of a split-patch antenna with a rectangular central strip and shorting pins, which generates a strong localized electric field of approximately 7000 V/m. This field enhancement ensures effective interaction with the test dielectric material, leading to accurate characterization. A simple and computationally efficient analytical model is developed to compute the permittivity of unknown dielectric materials (UDMs), achieving a maximum error of less than 4.7%. The proposed sensor is capable of characterizing both thin and thick dielectric samples, and it can be suitable for engineering, material science, industrial quality control, and biomedical sensing applications.