<p>This publication reports a novel hexagonal-structured localized surface plasmon resonance&#xa0;(LSPR) based photonic crystal fiber&#xa0;(PCF) sensor integrating gold, indium tin oxide&#xa0;(ITO), and silver as plasmonic materials. Utilizing COMSOL Multiphysics 6.1, the sensor’s structure was designed and a comprehensive performance analysis was conducted to optimize significant parameters. Results indicate a peak wavelength sensitivity of 26,000 nm/RIU, coupled with a high figure of merit (FOM) of 512.67 RIU<sup>−1</sup>, and an impressive sensor resolution of 3.846 × 10<sup>–6</sup> RIU. Dual polarization peak shift sensitivity (DPPSS) was utilized to improve the sensor’s dual-resonance response, reaching a maximum DPPSS of 25,960 nm/RIU, ensuring unparalleled sensitivity to refractive index changes. The suggested sensor offers a broad spectrum for analyte detection, with refractive indices spanning from 1.3 to 1.45, and is capable of detecting wavelengths between 310 and 490 nm for y-polarization, and 500 nm and 1600&#xa0;nm for x-polarization, encompassing from ultraviolet&#xa0;(UV) to near-infrared&#xa0;(NIR) spectra. This leading-edge, fabrication friendly sensor promises high accuracy in analyte detection and is well-suited for a diverse range of broadband applications in fields such as next-generation sensing, biosensing, medical diagnostics, and nanotechnologies. Moreover, the design is resilient to fabrication tolerances, maintaining consistent performance despite slight manufacturing variations.</p>

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Ultra-Sensitive LSPR-PCF Design with Dual Resonance for Both Polarizations and Broad Wavelength Range for Next-Generation Sensing

  • Md. Ehsanul Haque,
  • Nusrat Jahan Diya,
  • Md. Shaikh Salman,
  • Shah Md. Salimullah,
  • Russel Reza Mahmud

摘要

This publication reports a novel hexagonal-structured localized surface plasmon resonance (LSPR) based photonic crystal fiber (PCF) sensor integrating gold, indium tin oxide (ITO), and silver as plasmonic materials. Utilizing COMSOL Multiphysics 6.1, the sensor’s structure was designed and a comprehensive performance analysis was conducted to optimize significant parameters. Results indicate a peak wavelength sensitivity of 26,000 nm/RIU, coupled with a high figure of merit (FOM) of 512.67 RIU−1, and an impressive sensor resolution of 3.846 × 10–6 RIU. Dual polarization peak shift sensitivity (DPPSS) was utilized to improve the sensor’s dual-resonance response, reaching a maximum DPPSS of 25,960 nm/RIU, ensuring unparalleled sensitivity to refractive index changes. The suggested sensor offers a broad spectrum for analyte detection, with refractive indices spanning from 1.3 to 1.45, and is capable of detecting wavelengths between 310 and 490 nm for y-polarization, and 500 nm and 1600 nm for x-polarization, encompassing from ultraviolet (UV) to near-infrared (NIR) spectra. This leading-edge, fabrication friendly sensor promises high accuracy in analyte detection and is well-suited for a diverse range of broadband applications in fields such as next-generation sensing, biosensing, medical diagnostics, and nanotechnologies. Moreover, the design is resilient to fabrication tolerances, maintaining consistent performance despite slight manufacturing variations.