Two improving approaches for faulty interaction localization using logistic regression analysis
摘要
Faulty Interaction Localization (FIL) is a process to identify which combination of input parameter values induced test failures in combinatorial testing. An accurate and fast FIL provides helpful information to fix defects causing the test failure. One type of conventional FIL approach, which analyzes test results of whole test cases and estimates the suspiciousness of each combination, has two main concerns; (1) the accuracy is not enough, (2) the huge time cost is sometimes needed. In this paper, we propose two novel approaches to improve those concerns.