<p>The complex dielectric permittivity of silicon compounds is measured in the microwave range. The measurement is carried out using a&#xa0;method based on determining half-wave resonances in a&#xa0;coaxial line filled with a&#xa0;dielectric with unknown properties. Based on the measurements obtained, the excitation of high-frequency oscillations in a&#xa0;nonlinear transmission line with saturated ferrite with high-voltage insulation in the form of a&#xa0;silicon compound is simulated numerically. The complex permittivity dependence on frequency is described by the Lorentz model.</p>

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Measurement of complex dielectric permittivity of organosilicon compounds in the microwave range for application as insulation in nonlinear transmission lines with ferrite

  • P. V. Priputnev,
  • A. I. Klimov,
  • D. S. Kokin

摘要

The complex dielectric permittivity of silicon compounds is measured in the microwave range. The measurement is carried out using a method based on determining half-wave resonances in a coaxial line filled with a dielectric with unknown properties. Based on the measurements obtained, the excitation of high-frequency oscillations in a nonlinear transmission line with saturated ferrite with high-voltage insulation in the form of a silicon compound is simulated numerically. The complex permittivity dependence on frequency is described by the Lorentz model.