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<p>The article develops an adaptive multiple dependent states (AMDS) sampling inspection plan based on the mean lifetime quality characteristic that follows non-normal distributions, viz., exponential and Lindley distributions. This plan measures the quality of the lot by its mean (<InlineEquation ID="IEq1"> <EquationSource Format="TEX">\(\mu \)</EquationSource> </InlineEquation>). We have estimated the optimal plan parameters of the proposed technique using nonlinear optimisation approaches, considering the acceptance and rejection/limiting quality levels. We have compared the sample sizes of our proposed sampling plan with those of the existing multiple-dependent-state (MDS) sampling inspection plan and the traditional single-sampling inspection plan for the variable. Finally, we have used a real-world dataset and implemented our proposed plan to evaluate its efficiency.</p>

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An adaptive multiple dependent state sampling inspection plan based on Lindley and exponential distributions

  • 期刊论文

  • 发表日期：

    2026年6月3日

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  • Shovan Biswas,
  • Ajeyaa Sinha Roy,
  • Sandipan Maiti

摘要

The article develops an adaptive multiple dependent states (AMDS) sampling inspection plan based on the mean lifetime quality characteristic that follows non-normal distributions, viz., exponential and Lindley distributions. This plan measures the quality of the lot by its mean ( \(\mu \) ). We have estimated the optimal plan parameters of the proposed technique using nonlinear optimisation approaches, considering the acceptance and rejection/limiting quality levels. We have compared the sample sizes of our proposed sampling plan with those of the existing multiple-dependent-state (MDS) sampling inspection plan and the traditional single-sampling inspection plan for the variable. Finally, we have used a real-world dataset and implemented our proposed plan to evaluate its efficiency.