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<p>We theoretically investigate atomic localization via the absorption or damping characteristics of the surface plasmon polaritons (SPPs) waves using 2D atomic microscopy at the interface of dielectric-graphene layer. By employing the density matrix formalism, we calculate the medium’s complex dielectric function and study the (SPPs) dispersion relation, especially its imaginary part to analyze the atomic localization within a unit wavelength domain <InlineEquation ID="IEq1"> <EquationSource Format="TEX">\(-\pi \le kx \le \pi \)</EquationSource> </InlineEquation> and <InlineEquation ID="IEq2"> <EquationSource Format="TEX">\(-\pi \le ky \le \pi \)</EquationSource> </InlineEquation>. By varying the system’s parameters, such as detunings, Rabi frequencies, field directions and phase of the control fields, we precisely manipulate the crater- and peak-shaped localization patterns. Particularly, the sharp localization peaks can be dynamically shifted between spatial quadrants and dual peaks can be merged into a single peak. Our findings reveal theoretical insight of the controlled atomic localization at nanoscale interfaces, enabling practical applications in high-resolution plasmonic microscopy, label-free biosensing, creation of advanced optoelectronic and photonic devices, such as nanoscale modulators, photodetectors, nano-lasers, plasmonic nanolithography systems and integrated on-chip photonic circuits.</p>

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Surface plasmon polaritons absorption-driven atomic microscopy at the dielectric-graphene interface

  • 期刊论文

  • 发表日期：

    2026年5月26日

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  • Inzimam Ul Haq,
  • Javid Ullah,
  • Abbas Ghaffar,
  • Rashid Ahmad

摘要

We theoretically investigate atomic localization via the absorption or damping characteristics of the surface plasmon polaritons (SPPs) waves using 2D atomic microscopy at the interface of dielectric-graphene layer. By employing the density matrix formalism, we calculate the medium’s complex dielectric function and study the (SPPs) dispersion relation, especially its imaginary part to analyze the atomic localization within a unit wavelength domain \(-\pi \le kx \le \pi \) and \(-\pi \le ky \le \pi \) . By varying the system’s parameters, such as detunings, Rabi frequencies, field directions and phase of the control fields, we precisely manipulate the crater- and peak-shaped localization patterns. Particularly, the sharp localization peaks can be dynamically shifted between spatial quadrants and dual peaks can be merged into a single peak. Our findings reveal theoretical insight of the controlled atomic localization at nanoscale interfaces, enabling practical applications in high-resolution plasmonic microscopy, label-free biosensing, creation of advanced optoelectronic and photonic devices, such as nanoscale modulators, photodetectors, nano-lasers, plasmonic nanolithography systems and integrated on-chip photonic circuits.