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<p>Cadmium oxide (CdO) thin film was grown on a glass substrate at room temperature using the Successive ionic layer adsorption and reaction (SILAR) method. The grown thin films were annealed at 350<sup>0</sup>C and 400<sup>0</sup>C for 30&#xa0;min. Structural and optical properties of CdO thin films after annealing were examined. Analyzes were made with X-ray diffractometer (XRD) and Scanning electron microscope-Energy dispersive X-ray spectroscopy (SEM-EDAX) devices for structural properties, and UV–Vis devices for optical properties. The XRD peak intensities of CdO thin films exposed to annealing temperature increased and the crystal structure improved. The bandgap energy range decreased from 2.48&#xa0;eV to 2.37&#xa0;eV with the effect of annealing temperature.</p>

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Fabrication of CdO thin films with SILAR: Influence of annealing temperature on physical properties

  • 期刊论文

  • 发表日期：

    2025年3月17日

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  • Tuba Çayir Taşdemirci

摘要

Cadmium oxide (CdO) thin film was grown on a glass substrate at room temperature using the Successive ionic layer adsorption and reaction (SILAR) method. The grown thin films were annealed at 3500C and 4000C for 30 min. Structural and optical properties of CdO thin films after annealing were examined. Analyzes were made with X-ray diffractometer (XRD) and Scanning electron microscope-Energy dispersive X-ray spectroscopy (SEM-EDAX) devices for structural properties, and UV–Vis devices for optical properties. The XRD peak intensities of CdO thin films exposed to annealing temperature increased and the crystal structure improved. The bandgap energy range decreased from 2.48 eV to 2.37 eV with the effect of annealing temperature.