<p>The article discusses methods for reducing the time required to inspect a batch of mass-produced items. The existing methods do not provide a means to inspect the entire batch in a single cycle of inspection of one product. In order to minimize the time required for inspection using a single inspection tool (regardless of the statistical characteristics of batch parameters), a new method was developed. This method can be used to inspect items of a certain class in a batch using one inspection tool and reference pieces. The monitored parameter of the item has two different values: the item is considered non-defective or defective depending on whether the first or second value is reached. Inspection (e.g., of electromagnetic relays) is carried out using reference pieces with known values of the monitored parameter. The batch size, measurement conditions, and defectiveness criteria under specified conditions are set according to the specified method. Reference pieces are connected to each item in the batch in parallel with the outputs used to monitor the parameter. The value of the monitored parameter of the reference piece differs from the specified values of the monitored parameter of the item. The reference pieces are connected in series and numbered sequentially, according to the position of the reference pieces with the items. The parameter value of the first reference piece is specified, and the parameters of the remaining reference pieces are set as a geometric sequence with a ratio of two raised to a power that depends on the reference piece position number. The monitored parameter is measured simultaneously for all items in the batch with reference pieces; the total value of the monitored parameter is determined, and it is divided by that of the first reference piece. The quotient is obtained, and the nearest integer is found, which is represented in binary notation. The position number of the defective item is determined by the bit place holding 1 (if reaching the first value of the monitored parameter of the item is considered to be a defect) or 0 (if reaching the second value is considered to be a defect). The functional flow block diagram for implementing the developed method is presented, and the operating principle of the device is described. An example of method application is provided. As compared to the piece-by-piece inspection, this method reduces the time required to inspect a batch by a factor equal to the batch size. The obtained results can be used by specialists in inspection automation and by technologists in the development of processes involving product inspection operations.</p>

Method for identifying defective items in a batch based on one result of measuring a monitored parameter

期刊论文
发表日期：

2025年11月1日

查看全文

Vladimir I. Mironchenko

摘要

The article discusses methods for reducing the time required to inspect a batch of mass-produced items. The existing methods do not provide a means to inspect the entire batch in a single cycle of inspection of one product. In order to minimize the time required for inspection using a single inspection tool (regardless of the statistical characteristics of batch parameters), a new method was developed. This method can be used to inspect items of a certain class in a batch using one inspection tool and reference pieces. The monitored parameter of the item has two different values: the item is considered non-defective or defective depending on whether the first or second value is reached. Inspection (e.g., of electromagnetic relays) is carried out using reference pieces with known values of the monitored parameter. The batch size, measurement conditions, and defectiveness criteria under specified conditions are set according to the specified method. Reference pieces are connected to each item in the batch in parallel with the outputs used to monitor the parameter. The value of the monitored parameter of the reference piece differs from the specified values of the monitored parameter of the item. The reference pieces are connected in series and numbered sequentially, according to the position of the reference pieces with the items. The parameter value of the first reference piece is specified, and the parameters of the remaining reference pieces are set as a geometric sequence with a ratio of two raised to a power that depends on the reference piece position number. The monitored parameter is measured simultaneously for all items in the batch with reference pieces; the total value of the monitored parameter is determined, and it is divided by that of the first reference piece. The quotient is obtained, and the nearest integer is found, which is represented in binary notation. The position number of the defective item is determined by the bit place holding 1 (if reaching the first value of the monitored parameter of the item is considered to be a defect) or 0 (if reaching the second value is considered to be a defect). The functional flow block diagram for implementing the developed method is presented, and the operating principle of the device is described. An example of method application is provided. As compared to the piece-by-piece inspection, this method reduces the time required to inspect a batch by a factor equal to the batch size. The obtained results can be used by specialists in inspection automation and by technologists in the development of processes involving product inspection operations.