Abstract <p>Due to the rapid development of telecommunications systems toward 5G and 6G, there is a high demand for dielectric materials with low dielectric permittivity and low tangent. In this study presents a comprehensive investigation of sol–gel derived forsterite (Mg₂SiO₄) ceramics, focusing on their structural, microstructural, and dielectric properties. XRD and Rietveld-refinement analysis confirmed phase-pure orthorhombic forsterite (space group <i>Pbnm</i>) with no secondary phases. FESEM/EDS analysis revealed a well-defined microstructure and stoichiometric Mg₂SiO₄ composition (Mg:Si:O ≈ 2:1:4 atomic ratio). The bulk density was measured as 2.56 g/cm³, corresponding to ~78% of theoretical density. Dielectric and impedance spectroscopy studies demonstrated excellent functional properties: low relative permittivity (ε_r ~ 9.12 at 1 MHz) and minimal loss tangent (tan δ &lt; 0.015). Complex impedance analysis showed a decrease in the real part of impedance (Z′) with increasing frequency and temperature, while Nyquist plots exhibited single semicircular arcs, indicative of non-Debye relaxation dominated by grains. Electrical modulus spectra revealed relaxation peaks shifting to higher frequencies with temperature. The exponent <i>s</i> decreased from 1.85 (100 °C) to 1.76 (400 °C), indicating correlated barrier hopping (CBH) conduction. The DC conductivity followed Arrhenius behavior with an activation energy (<i>E</i>_<i>a</i>) of 0.19 eV, consistent with polaron-assisted transport. This work established structure-property relationships linking sol–gel processing, microstructure, and optimized dielectric performance.</p> Graphical Abstract <p></p>