Analysis of proton irradiation effects on thickness and crystal structure of tungsten thin layers
摘要
In this research, tungsten thin films on graphite substrates have been investigated as plasma-facing materials and the effects of protons being released from MTPF-2 device have been evaluated. Tungsten coatings were prepared using RF magnetron sputtering method under varying conditions. The coatings were irradiated with protons, and RBS analysis revealed a significant average thickness reduction rate per shot. XRD and GIXRD analyses identified tungsten peaks in the samples, which disappeared after irradiation. SEM images showed a smooth surface before irradiation but revealed significant structural damage post-irradiation. EDX analysis indicated a substantial decrease in tungsten’s weight and atomic percentages after exposure.