Validation of a Virtual Ray Tracing Instrument for Dimensional X-Ray CT Measurements
摘要
A new Forward Ray Tracing Instrument (FRTI) for simulating X-ray CT scanners is presented. The FRTI enables the modelling of various detector geometries to optimise instrument designs. The FRTI is demonstrated by comparing experimentally measured sphere centre-to-centre distances from two material measures with digital clones. The measured length deviations were smaller than the reconstructed grid spacing for both the experimental and simulated acquisitions. As expected the experimentally measured length deviations were larger than the simulated measurements. The results demonstrate the FRII’s capability of simulating an X-ray CT scanner and performing length measurements.