The recombination rates of D atoms in solid D \(_2\) films were measured in the temperature range 0.23– \(1.64\,\textrm{K}\) . Atoms were formed in thin D \(_2\) films by maintaining radio-frequency discharge above the film surface for several days. After stopping discharge the decay of D atoms concentrations was monitored at different temperatures by the method of electron spin resonance (ESR). Decreasing the films temperature from 1.64 to 0.23 K resulted in reducing the recombination rate from \(7.2\times 10^{-26}\,\textrm{cm}^3\textrm{s}^{-1}\) to \(1.0\times 10^{-27}\,\textrm{cm}^3\textrm{s}^{-1}\) .
