Array of Optical Transition-Edge Sensors Fabricated by Ion-Milling Process Evaluated with Microwave Multiplexer for 100 or More Sensors
摘要
The optical transition-edge sensor (TES) pushes the boundary on fault-tolerant photonic quantum computers and low-invasive bio-imaging systems. As these systems evolve, there is an increasing demand for using a TES array comprising many sensors, often exceeding one hundred. Critical temperature