The role of Sn2+/Sn4+ precursors on the structural and optical properties of Yb-based oxide thin films
摘要
In this study, two different precursor solutions containing SnCl2⋅2H2O and SnCl4⋅5H2O, which provide Sn2+ and Sn4+ ions, respectively, together with YbCl3⋅6H2O, were prepared. The solutions prepared using different tin precursor materials were deposited as thin films onto quartz glass substrates by the ultrasonic spray pyrolysis (USP) method. X-ray diffraction (XRD) analysis showed that the thin films obtained from solution A were shifted to the left compared to the XRD pattern of the Yb2Cu2O5 compound, while the thin films obtained from solution B were consistent with the crystal structure of Yb2Sn2O7. Scanning electron microscopy (SEM) revealed that the thin-film surfaces exhibited different morphologies. The thickness of both thin films was determined to be ~ 685 nm. The average transmittance in the visible region (380–700 nm) was found to be 80% for the thin film produced from solution A and 85% for the thin film produced from solution B. The optical band gap values for the thin films produced from solution A and solution B were calculated from Tauc plots as 4.78 and 4.53 eV, respectively. The wavelength-dependent variation of the extinction coefficient and refractive index was examined. As a result, it was observed that different precursor materials have a significant effect on the structural and optical properties of the produced thin films.