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<p>The preparation and analysis of thin films of “tin dioxide” doped with various elements, including cobalt (Co), iron (Fe), aluminum (Al), nickel (Ni), and indium (In), were carried out using the spin-coating technique. This approach is approved for fine regulation of the layer depth, and the surface homogeneity of the layers, ensuring homogeneous and high-quality films, which were confirmed by the characterization tools. In this paper, the framework investigation of the samples was carried out using X-ray diffraction (XRD), revealing the crystalline structure, so, according to the obtained results a tetragonal rutile-type SnO<sub>2</sub> phase was observed for all samples, the consequence of doping on their crystallinity is clearly observed on the lattice parameter ‘<i>c</i>’ which varies from 2.78 to 4.745&#xa0;Å, depending on the nature of the dopant. In parallel, optical characterization was conducted through UV–Visible spectroscopy, allowing the study of the absorption and transmission properties of light in the doped samples. This indicates the variation of the transmittance between 42 and 75%, as a function of the dopant type. Also, scanning electron microscopy (SEM) has been used to examine the morphology of tin dioxide thin films, providing a detailed visualization of the surface of the doped thin films, including information on their morphology and uniformity. The results of this study offer an in-depth understanding of the structural, optical, and morphological properties of doped tin dioxide thin films, paving the way for their potential applications in optoelectronics.</p>

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Structural and optical properties of (Co, Fe, Al, In, and Ni)-doped SnO2 thin films prepared by spin coating technique

  • 期刊论文

  • 发表日期：

    2026年5月8日

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  • C. Louardi,
  • O. Zahot,
  • F. Z. Kamli,
  • L. Soussi,
  • H. Akarni,
  • M. Bouzidi,
  • N. Benaissa,
  • T. Garmim,
  • A. El Bachiri,
  • Z. El Jouad,
  • A. Louardi

摘要

The preparation and analysis of thin films of “tin dioxide” doped with various elements, including cobalt (Co), iron (Fe), aluminum (Al), nickel (Ni), and indium (In), were carried out using the spin-coating technique. This approach is approved for fine regulation of the layer depth, and the surface homogeneity of the layers, ensuring homogeneous and high-quality films, which were confirmed by the characterization tools. In this paper, the framework investigation of the samples was carried out using X-ray diffraction (XRD), revealing the crystalline structure, so, according to the obtained results a tetragonal rutile-type SnO2 phase was observed for all samples, the consequence of doping on their crystallinity is clearly observed on the lattice parameter ‘c’ which varies from 2.78 to 4.745 Å, depending on the nature of the dopant. In parallel, optical characterization was conducted through UV–Visible spectroscopy, allowing the study of the absorption and transmission properties of light in the doped samples. This indicates the variation of the transmittance between 42 and 75%, as a function of the dopant type. Also, scanning electron microscopy (SEM) has been used to examine the morphology of tin dioxide thin films, providing a detailed visualization of the surface of the doped thin films, including information on their morphology and uniformity. The results of this study offer an in-depth understanding of the structural, optical, and morphological properties of doped tin dioxide thin films, paving the way for their potential applications in optoelectronics.