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<p>Perovskite materials have rapidly gained attention for optoelectronic applications due to their outstanding structural, optical, and electronic properties, which are highly sensitive to synthesis methods. This study presents a comparative analysis of methylammonium-free, all-inorganic Rb<sub>3</sub>Bi<sub>2</sub>I<sub>9</sub> perovskite thin films fabricated via single-step solution processing and single-source thermal evaporation. X-ray diffraction confirms a monoclinic crystal structure for both film types, indicating good crystallinity. Thermally grown films exhibit larger crystallite sizes (∼&#xa0;71.4&#xa0;nm) and reduced microstrain, whereas solution-processed films exhibit smaller crystallite sizes (∼&#xa0;55.5&#xa0;nm). X-ray photoelectron spectroscopy analysis reveals multiple chemical bonding states, while optical measurements show that thermally grown films possess a narrower bandgap (∼&#xa0;1.78&#xa0;eV) and lower Urbach energy (∼&#xa0;153&#xa0;meV), reflecting fewer defect states and superior electronic quality. Morphological studies demonstrate that thermal evaporation yields dense, uniform, and continuous films, overcoming the non-uniformity typical of solution-processed films. Photodetectors based on thermally grown RBI display superior performance, including rapid response times (∼&#xa0;40&#xa0;ms rise, ∼&#xa0;12&#xa0;ms recovery), high responsivity (∼&#xa0;0.47&#xa0;mA/W), and detectivity (∼&#xa0;3.47 × 10⁹ Jones) in the 380–470&#xa0;nm range. These results establish thermal evaporation as a robust, scalable method for producing stable, defect-free, high-performance inorganic bismuth-based perovskite photodetectors, advancing the development of environmentally friendly, durable optoelectronic devices.</p>

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Processing-route engineering of methylammonium-free all-inorganic Rb3Bi2I9 perovskites for high-performance optoelectronics

  • 期刊论文

  • 发表日期：

    2026年3月17日

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  • Shruti Shah,
  • Somnath Ladhane,
  • Jyoti Thombare,
  • Mansi Ingole,
  • Swati Rahane,
  • Priti Vairale,
  • Azam Mayabadi,
  • Yogesh Hase,
  • Ashish Waghmare,
  • Shashikant P. Patole,
  • Sandesh Jadkar

摘要

Perovskite materials have rapidly gained attention for optoelectronic applications due to their outstanding structural, optical, and electronic properties, which are highly sensitive to synthesis methods. This study presents a comparative analysis of methylammonium-free, all-inorganic Rb3Bi2I9 perovskite thin films fabricated via single-step solution processing and single-source thermal evaporation. X-ray diffraction confirms a monoclinic crystal structure for both film types, indicating good crystallinity. Thermally grown films exhibit larger crystallite sizes (∼ 71.4 nm) and reduced microstrain, whereas solution-processed films exhibit smaller crystallite sizes (∼ 55.5 nm). X-ray photoelectron spectroscopy analysis reveals multiple chemical bonding states, while optical measurements show that thermally grown films possess a narrower bandgap (∼ 1.78 eV) and lower Urbach energy (∼ 153 meV), reflecting fewer defect states and superior electronic quality. Morphological studies demonstrate that thermal evaporation yields dense, uniform, and continuous films, overcoming the non-uniformity typical of solution-processed films. Photodetectors based on thermally grown RBI display superior performance, including rapid response times (∼ 40 ms rise, ∼ 12 ms recovery), high responsivity (∼ 0.47 mA/W), and detectivity (∼ 3.47 × 10⁹ Jones) in the 380–470 nm range. These results establish thermal evaporation as a robust, scalable method for producing stable, defect-free, high-performance inorganic bismuth-based perovskite photodetectors, advancing the development of environmentally friendly, durable optoelectronic devices.