Electrical and ferroelectric characterization of CaBi4Ti4O15 for electronic device applications
摘要
Bismuth layer-structured ferroelectrics (BLSFs) have recently gained interest due to their potential applications in high-temperature sensors, actuators, MEMS devices, and transducers. This study aimed at investigating the electrical and ferroelectric properties of calcium bismuth titanate (CaBi4Ti4O15) ceramics, synthesized by the solid-state reaction route. X-ray diffraction analysis confirms an orthorhombic crystal structure, while field-emission scanning electron microscopic studies reveal the formation of uniformly distributed grains, indicating good microstructural homogeneity. Complex impedance spectroscopic analysis was conducted to estimate the dependence of electrical properties on temperature and frequency. The conductivity spectra adhered to Jonscher’s power law, suggesting a conduction mechanism based on non-overlapping small polaron tunnelling. The collective contribution of the grains, grain boundaries, and electrode interfaces on the electrical response was revealed by the Nyquist plots. The analysis of activation energy validated the behaviour of the negative temperature coefficient of resistance (NTCR). Furthermore, a hopping conduction process (non-Debye type relaxation) in CaBi4Ti4O15 (CBT) was predicted from the complex modulus spectra. This study highlighted the potential of CBT for high-temperature electronic devices and energy storage application.