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<p>In this paper, the optical power (OP) behavior in the degradation of deep ultraviolet LEDs is investigated in this work. Our research considers the coupled mechanisms involving junction temperature and current and demonstrates that three mechanisms synergistically drive the OP degradation: 1. junction temperature rise induced by self-heating effects, 2. generation of non-radiative recombination centers under electrical stress, and 3. current–temperature co-induced degradation with an activation energy of 0.05 eV. A mathematical model for lifetime prediction is introduced and matched well with the OP degradation. The lifetime is inversely proportional to the seventh power and fifth power of current density when considering the self-heating effect and retaining the influence of high temperature, respectively, suggesting the significance of thermal failure.</p>

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Investigation of thermal accumulation and lifetime in AlGaN-based UV-C LEDs degradation under current stress

  • 期刊论文

  • 发表日期：

    2025年11月20日

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  • Mengwei Su,
  • Hongxia Liu,
  • Chang Liu

摘要

In this paper, the optical power (OP) behavior in the degradation of deep ultraviolet LEDs is investigated in this work. Our research considers the coupled mechanisms involving junction temperature and current and demonstrates that three mechanisms synergistically drive the OP degradation: 1. junction temperature rise induced by self-heating effects, 2. generation of non-radiative recombination centers under electrical stress, and 3. current–temperature co-induced degradation with an activation energy of 0.05 eV. A mathematical model for lifetime prediction is introduced and matched well with the OP degradation. The lifetime is inversely proportional to the seventh power and fifth power of current density when considering the self-heating effect and retaining the influence of high temperature, respectively, suggesting the significance of thermal failure.