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<p>In recent years, the problems posed by electromagnetic interference (EMI) have proliferated and have jeopardized sophisticated electronic equipment and public health. Researchers have developed and designed a large number of efficient EMI shielding materials, but balancing high EMI shielding effectiveness (SE) with low reflection remains a major challenge. In this study, by combining two-dimensional Ti<sub>3</sub>C<sub>2</sub>T<sub>x</sub>, magnetic nickel, and CNTS, we have reduced the reflection of highly conductive materials and balanced the shielding performance. The EMI SE and reflectivity of Ni@CNTS/Ti<sub>3</sub>C<sub>2</sub>T<sub>x</sub>/PDMS materials were 90 dB and 78%, respectively, with a low loading of Ni (3%, wt%) and Mxene(2%, wt%). The elongation at break and tensile strength are 120% and 440 kPa, respectively. Our method reduces reflection from highly conductive materials while providing a high shielding capacity, offering insights into reducing the reflection of EMWs from highly conductive materials.</p>

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Asymmetric Ni@CNTS/Ti3C2Tx/PDMS materials for high-performance electromagnetic interference shielding and mitigation high reflectivity caused by high conductivity

  • 期刊论文

  • 发表日期：

    2025年10月27日

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  • Wenjing Xi,
  • Chenkun Tu,
  • Jiapeng Zhang

摘要

In recent years, the problems posed by electromagnetic interference (EMI) have proliferated and have jeopardized sophisticated electronic equipment and public health. Researchers have developed and designed a large number of efficient EMI shielding materials, but balancing high EMI shielding effectiveness (SE) with low reflection remains a major challenge. In this study, by combining two-dimensional Ti3C2Tx, magnetic nickel, and CNTS, we have reduced the reflection of highly conductive materials and balanced the shielding performance. The EMI SE and reflectivity of Ni@CNTS/Ti3C2Tx/PDMS materials were 90 dB and 78%, respectively, with a low loading of Ni (3%, wt%) and Mxene(2%, wt%). The elongation at break and tensile strength are 120% and 440 kPa, respectively. Our method reduces reflection from highly conductive materials while providing a high shielding capacity, offering insights into reducing the reflection of EMWs from highly conductive materials.