<p>A series of Co thin films with various thicknesses ranging from 50 to 400&#xa0;nm has been fabricated using thermal heating under vacuum. The impact of the magnetic layer thickness on the magnetocrystalline anisotropy of the films is studied. The alternating gradient field magnetometer, and the atomic force microscopy, as well as the Brillouin light scattering tools have been used to carry out the static and the dynamic properties of these films. The films are principally c-axis oriented. MFM observations exhibit stripe domain patterns. The magnetization easy axis was found to lie in the film plane, the measured spontaneous magnetization being 1410&#xa0;emu/cm<sup>3</sup>. We measured and computed the effective magnetocrystalline factors. Enhanced constant anisotropy values are found. Values of <i>K</i><sub><i>u</i></sub> up to 8.40 × 10<sup>6</sup>&#xa0;erg/cm<sup>3</sup> have been measured. These values have been found to decrease with the increase of the thickness layer.</p>

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Growth, static and dynamic magnetic properties of cobalt thin films

  • Ahmed Kharmouche

摘要

A series of Co thin films with various thicknesses ranging from 50 to 400 nm has been fabricated using thermal heating under vacuum. The impact of the magnetic layer thickness on the magnetocrystalline anisotropy of the films is studied. The alternating gradient field magnetometer, and the atomic force microscopy, as well as the Brillouin light scattering tools have been used to carry out the static and the dynamic properties of these films. The films are principally c-axis oriented. MFM observations exhibit stripe domain patterns. The magnetization easy axis was found to lie in the film plane, the measured spontaneous magnetization being 1410 emu/cm3. We measured and computed the effective magnetocrystalline factors. Enhanced constant anisotropy values are found. Values of Ku up to 8.40 × 106 erg/cm3 have been measured. These values have been found to decrease with the increase of the thickness layer.