Crystal structure, bond characteristics and microwave dielectric properties of rutile Cu0.5Ti0.5NbO4 ceramics sintered at low temperatures
摘要
This study centers on synthesizing low-firing Cu0.5Ti0.5NbO4 microwave dielectric ceramics and probing its structure–property relationship. The Cu0.5Ti0.5NbO4 ceramics sintered at 950 ℃ show the best microwave dielectric properties. Porosity and grain growth are extrinsic factors impacting the microwave dielectric property development. In terms of intrinsic structural aspects, results reveal that Nb–O bonds are more important than Cu/Ti–O bonds in modifying the bond ionicities and susceptibilities, making them vital for determining dielectric polarization in Cu0.5Ti0.5NbO4 ceramics. The high proportion of lattice energies from Nb–O bonds also shows their significance for lattice stability, which directly affects intrinsic dielectric loss. The theoretical coefficient of thermal expansion for Cu0.5Ti0.5NbO4 ceramics is about 4.54 ppm/℃, with Cu–O bonds contributing around 54%. The microwave dielectric properties of Cu0.5Ti0.5NbO4 ceramics sintered at 950 °C are εr = 73.4, Q × f = 6241 GHz, τf = 227.2 ppm/℃, which is influenced by the interplay of internal and external factors. By analyzing the chemical bond characteristics, specific guidance can be provided for the doping modification of the Cu0.5Ti0.5NbO4 system.