Effect of annealing time treatment on structural and optical properties of In2S3 thin films for optoelectronic devices and sensor technologies application
摘要
This study explores the effect of annealing duration (10, 20, 30, and 40 min) on the properties of Indium Sulfide (β-In2S3) thin films. The films were fabricated by annealing indium thin films in a sulfur-rich environment via chemical vapor deposition (CVD) method. Raman spectroscopy revealed enhanced peak intensities for β-In2S3 vibrational modes, indicating improved structural coherence. Photoluminescence measurements showed a notable increase in excitonic emission intensity, with a peak at 2.15 eV becoming more pronounced after 40 min of annealing. Additionally, UV–Visible absorption demonstrated both a Burstein–Moss shift and Drude absorption behavior, alongside a significant increase in the optical bandgap, reaching values of 1.66 eV, 1.82 eV, and 2.2 eV for annealing durations of 20, 30, and 40 min, respectively. First-principles calculations using VASP confirmed the direct bandgap nature of β-In2S3, with HSE06 calculations yielding a bandgap of 2.0 eV, closely aligning with experimental observations. These findings underscore the crucial role of annealing time in optimizing β-In2S3 thin films for advanced applications in photovoltaics, optoelectronics, and sensing technologies, where high crystallinity and superior optical properties are essential for device efficiency and reliability.