Strain-induced structural and electronic modulation in gas-phase CVD-grown monolayer MoS2 films
摘要
Atomically-thin transition metal dichalcogenides (TMDs) are promising for next-generation flexible electronic devices. Understanding their mechanical behaviour under applied strain is key for practical applications. In this work, we investigated the strain-induced structural and electronic changes in continuous monolayer MoS₂ grown by gas-phase chemical vapor deposition. Raman and photoluminescence spectroscopy are employed to in-situ study the MoS2 layers transferred on polycarbonate substrates with PMMA encapsulation. A correlative plot of Raman modes allowed us to distinguish whether changes in both encapsulated and non-encapsulated films are due to strain or n-type doping. The findings highlight the strain sensitivity of monolayer MoS2 and its potential for flexible electronics, offering critical knowledge for developing robust, strain-tolerant devices using gas-phase CVD-grown 2D TMDs.