The influence of varying density of dielectric layer on BME-MLCC

The multi-layer ceramic capacitors (MLCCs) with high reliability and excellent dielectric proprieties were successfully prepared using four parameters in the milling process. In this study, the density of dielectric layer increased as the milling strength which was determined by revolutions per minute (rpm) and the number of cycles. Furthermore, the surface of layers and the samples were analyzed using scanning electron microscopy (SEM) to validate the microstructural evolution. The dielectric properties, such as dielectric constant, loss and temperature character of capacitor (TCC), were found to significantly depend on the different dielectric layers for the four groups of MLCCs. And the samples were tested by high accelerated life test (HALT) methods. It has been concluded that enhancing the density of the layer can effectively improve the reliability of MLCCs. This is evidenced by an increase in the estimated lifetime of the MLCCs. In addition, the appearance of micro-crack and performance degradation occurs as the density of the layer continues to increase. Therefore, a prepared layer with moderate density can achieve a stable internal structure and high reliability.